Author Dr. R. Russell Rhinehart discusses his new book, Nonlinear Model-Based Control: Using First-Principles Models in Process Control, and explains why nonlinear first-principles models should be ...
Advanced process technologies, such as 90nm, 65nm, 45nm and below, present significant power management challenges for high performance semiconductors. Chip designers face increasing challenges in ...
Advanced process control systems manage multiple variables simultaneously, helping food manufacturers maintain consistent quality even when raw ingredients fluctuate. Four control strategies — ...