Forty years after its invention, atomic force microscopy has evolved from a simple surface imaging tool into one of the most versatile measurement platforms in ...

For smartphones and computers to become smaller and faster, technologies capable of precisely controlling electrical properties at the nanoscale—beyond what is visible to the naked eye—are essential.

Piezoresponse force microscopy (PFM), a lock-in-based mode of atomic force microscopy (AFM), enables sensitive ferroelectric domain imaging. However, fast imaging for either massive measurements or ...