Shrinking technology nodes and smaller process margins require improved photolithography overlay control. Generally, overlay measurement results are modeled with Cartesian polynomial functions for ...

Systems-based pharmaceutics case studies, challenges, and new uses were discussed at PSE’s Advanced Process Modeling Forum. Systems-based Pharmaceutics (SbP) uses a systems engineering approach and ...

Semiconductor process engineers would love to develop successful process recipes without the guesswork of repeated wafer testing. Unfortunately, developing a successful process can’t be done without ...

As-manufactured woven polymer matrix composites often exhibit in-situ cracking due to residual stresses that arise from curing. NASA’s Heatshield for Extreme Entry Environment Technology (HEEET) is a ...

Aspen Technology's Elinor Price describes how advanced process control modeling and simulation can become part of the modern control room. An upcoming feature article in January, "Changing Workforce ...